Author:
Wood R. F.,Lowndes Douglas H.,Christie W. H.
Abstract
ABSTRACTIt is shown that, in the pulsed-laser irradiation of crystalline or lightly damaged GaAs, good agreement is obtained between measured and calculated thresholds for melting, for catastrophic damage due to vaporization, and for the duration of surface melting at various energy densities. Good agreement between theory and experiment is also obtained for dopant profile spreading during pulsed-laser annealing.
Publisher
Springer Science and Business Media LLC
Cited by
6 articles.
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