Strain and Interdiffusion Profiles in Epitaxied AU/NI (100) Multilayers Deduced From X-Ray Diffraction Experiments

Abstract

AbstractAu(100)/Ni(100) periodic superlattices have been grown by the MBE technique specially for X-ray diffraction experiments. The nominal number of Ni planes deposited were 1.5, 2, 4 and 5 ML and the thickness of the gold layers was always 1.5 nm. The X-ray profiles have been simulated using a kinematical structure refinement program. The obtained strain profiles are in very good agreement with earlier HREM results. It is shown that a strong interdiffusion occurs during the growth.