Microstructural characterization of YBaCuO thin films deposited by rf magnetron sputtering as a function of annealing conditions-Reference-Cited by-同舟云学术

Microstructural characterization of YBaCuO thin films deposited by rf magnetron sputtering as a function of annealing conditions

Published:1991-02 Issue:2 Volume:6 Page:252-263
ISSN:0884-2914
Container-title:Journal of Materials Research
language:en
Short-container-title:J. Mater. Res.

Author:

Ece M.,Vook R.W.,Allen John P.

Abstract

Thin films of Y1Ba2Cu3O7−x have been prepared on MgO, SrTiO3/Al2O3, and Al2O3 substrates by rf magnetron sputtering. A buffer layer of SrTiO3 was deposited on Al2O3 by flash evaporation. The as-deposited films on MgO and SrTiO

Publisher

Springer Science and Business Media LLC

Subject

Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science

Reference15 articles.

1. High Resolution Transmission Electron Microscopy of Defects in HighTcSuperconductor Ba2YCu3Oy

2. 15 Wasa K. , Kitabatake M. , Adachi H. , Setsune K. , and Hirochi K. , American Institute of Physics Conference Proceedings, No. 165, American Vacuum Society Series 3, 1987, p. 38.

3. Y‐Ba‐Cu‐O thin films prepared by flash evaporation

4. Insitugrown YBa2Cu3O7−dthin films from single‐target magnetron sputtering

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