Author:
Freund Friedemann,Masuda Michael M.,Freund Minoru M.
Abstract
Some peculiar positive charge carriers are thermally generated in fused silica above 500 °C. These charge carriers appear to be positive holes, chemically O− states, probably arising from dissociation of peroxy defects. The charge carriers give rise to a pronounced positive surface charge which disappears upon cooling but can be quenched by rapid quenching from ≍800 °C. Reheating to ≍200 °C remobilizes these charge carriers and causes them to anneal below 400 °C. The generation of positive holes charge carriers may be important to understand failure mechanisms of SiO2 insulators.
Publisher
Springer Science and Business Media LLC
Subject
Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science
Cited by
20 articles.
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