Recent Progress of Low Temperature Poly Si TFT Technology

Author:

Yoneda Kiyoshi

Abstract

AbstractSince being introduced to the production line in 1996, replacing the first generation a-Si TFT line, low-temperature poly-Si production technology aimed at manufacturing small and medium size LCD products has improved steadily corresponding to customers' requirements for rapid growth of the DVC and DSC markets. In the future, this production technology must progress to actual industry technology levels in order to cope with production applied not only to large size displays, which have a major market share in the present display market, but also to a large glass substrate, which effectively cuts the cost of products, although improvement of production yield and productivity in terms of pursuing cost reduction must be proceeded.This paper has described existing problems of inherent low-temperature poly-Si TFT processes and their relating additional processes in present production methods. We have also discussed updating production technologies. To cope with production for a large size display, it is necessary to establish fabrication technology of higher performance TFTs with electron mobility larger than 200cm2/V s. We believe that one key technology is to fabricate a large-scale and highly-uniform recrystallized poly-Si film with smooth surface morphology as well as precisely-controlled grain size in production. To cope with production using a large glass substrate, it is essential to develop ELA equipment with laser power greater than 200W.

Publisher

Springer Science and Business Media LLC

Subject

General Engineering

Reference9 articles.

1. Low‐Temperature Polycrystalline Silicon Deposition by Very High Frequency Sputtering Using Ar and  H 2

2. 2.) Hayashi H. , Kunii M. , Suzuki N. , Kanaya Y. , Kuki M. , Minegishi M. , Urazono T. , Fujino M. , Noguchi T. , Yamazaki M. : “Fabrication of Low-Temperature Bottom-Gate Poly-Si TFTs on Large-Area Substrate by Linear-Beam Excimer Laser Crystallization and Ion Doping Method”, IEDM'95 Technical Digest, pp.829–832 (1995).

3. 3.) Morimoto Y. , Hirano K. , Abe H. , Kuwahara T. , Hasegawa I. , Yuda S. , Sotani N. and Yoneda K. : “A 2.4-in. Driver-Integrated Full-Color Quarter VGA (320x3x240) Poly-Si TFT LCD by a Novel Low Temperature Process Using a Combination of ELA and RTA Technology”, IEDM'95 Technical Digest, pp.837–840 (1995).

4. 5.) Yoneda K. : “Current Status of Production Technologies in Low-Temperature Poly-Silicon TFTs” Proc. of IDW'97, pp. 231–234(1997).

5. 8.) Giust G. K. , and Sigmon T. W. : “Sputtered Low-Temperature Laser-Crystallized Polysilicon Thin Film Transistors”, VLSI Symposium 1998, to be published.

Cited by 2 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Xenon Flash Lamp Annealing of Poly-Si Thin Films;Journal of The Electrochemical Society;2006

2. Process study and optimization for fabrication of poly-Si thin-film transistors on plastic substrates;Journal of the Society for Information Display;2005

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号  京ICP备18003416号-3