Utilization of Charged Particle Backscattering to Study the Near Surface Region of Glasses. Application to Depth Profiling of Lanthanium, Cerium, Thorium and Uranium Induced by Aqueous Leaching.
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Published:1981
Issue:
Volume:11
Page:
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ISSN:0272-9172
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Container-title:MRS Proceedings
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language:en
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Short-container-title:MRS Proc.
Author:
Trocellier Patrick,Nens Bernard,Engelmann Charles
Abstract
The Rutherford backscattering technique is useful for the determination of the concentration profiles of some heavy elements in the near surface region of glasses, but is not able to provide chemical information on the elements detected.
Publisher
Springer Science and Business Media LLC
Subject
General Engineering
Cited by
1 articles.
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