Author:
Chen K.C.,Mackenzie J. D.
Abstract
ABSTRACTPZT films on fused silica substrates were prepared by a multiple dipping-firing process from a stable solution of titanium isopropoxide, zirconium n-propoxide and lead 2- ethylhexanoate. The crystallization kinetics of the amorphous PZT films was studied by quantitative X-ray analysis. The crystallization of the amorphous film to perovskite phase
involved a transitional pyrochlore structure phase. The entire crystallization was described by a consecutive phase transformation process in which nucleation dominated.
Publisher
Springer Science and Business Media LLC
Cited by
57 articles.
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