Transmission electron microscopy of process-induced defects in β-SiC thin films-Reference-Cited by-同舟云学术

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Transmission electron microscopy of process-induced defects in β-SiC thin films

Published:1986-12 Issue:6 Volume:1 Page:811-819
ISSN:0884-2914
Container-title:Journal of Materials Research
language:en
Short-container-title:J. Mater. Res.

Author:

Carter C.H.,Davis R.F.,Nutt S.R.

Publisher

Springer Science and Business Media LLC

Subject

Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science

Cited by 92 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

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