In-Situ Measurement of Bending Strength of TiC Whiskers in the Scanning Electron Microscope

Abstract

ABSTRACTThe three–point bending strength of TiC whiskers was measured in a scanning electron microscope. The whisker samples have ∼ 50µm length and 2∼4µm diameter and are commercially available as reinforcements for composite materials. The distribution of the bending strengths of the whiskers showed a double peak around 5.2GPa and 30.4GPa, respectively. The difference in these values is attributed to differences in the cleavage strength of two crystal planes depending on whisker growth direction.