Interfacial overheating during melting of Si at 190 m/s

Author:

Tsao J. Y.,Peercy P. S.,Thompson Michael O.

Abstract

An upper limit is placed on the overheating at the liquid/solid interface during melting of (100) Si at high interface velocity. The limit is based on an energy-balance analysis of melt depths measured in real time during pulsed-laser melting of Si on sapphire. When combined with previous measurements of the freezing kinetics of Si, this limit indicates that the kinetics of melting and freezing are nonlinear, i.e., the undercooling required to freeze at modest (15 m/s) velocities is proportionately much greater than the overheating required to melt at high (190 m/s) velocities.

Publisher

Springer Science and Business Media LLC

Subject

Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science

Reference20 articles.

1. 17We use the values t3 = 3.7 ns, t 1, = 0.4 ns, Dsap = 0.012 cm2s (at 1400 K), and (See Ref. 9).

2. 15In units of δH, this has been evaluated (Ref. 9) to be , where c, (T) is the temperature-dependent specific heat of solid Si.

3. 13This can be seen by differentiation: (d/dt)(lδT) = (IδT) + 1δT = (Dv)/(vβ) - (Dvv)/(v2β) = 0. Physically, an increase in the interface overheating is offset by an accompanying decrease, due to an increased interface velocity, in the length scale /over which the temperature profile decays.

4. 12This quasi-steady-state approximation is valid if the rate of change of this length scale due to changes in interface velocity is slow compared to the interface velocity itself, l = Dv/v2 < u, which is the case here.

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