X-Ray Analysis of Alpha Mercuric Iodide Crystal Structure and Processing Effects

Abstract

ABSTRACTX-ray topography and rocking curve experiments were performed on α-mercuric iodide samples. As-grown crystals were examined for intrinsic defects and crystallinity. Orientation of certain defects depends on the direction of crystal growth. The propagation of as-grown crystalline features was documented. The extent of crystal damage introduced during various steps of device fabrication such as sawing, polishing, etching and contact deposition was explored. Coefficients of linear thermal expansion of α33 = 54 ± 5 (10−6/°C) along the tetragonal c-axis, \001] direction and ±ll = 11 ± 4 (10−6/°C) in the \100] direction were measured.