Ferroelectricity of Lead-Zirconate-Titanate Thin Films Prepared by Laser Ablation-Reference-Cited by-同舟云学术

Ferroelectricity of Lead-Zirconate-Titanate Thin Films Prepared by Laser Ablation

Published:1991 Issue: Volume:243 Page:
ISSN:0272-9172
Container-title:MRS Proceedings
language:en
Short-container-title:MRS Proc.

Author:

Ogawa Toshio,Kidoh Hideo,Yashima Hideyuki,Morimoto Akiharu,Shimizu Tatsuo

Abstract

AbstractLead-zirconate-titanate films were prepared by excimer laser ablation. The coercive field of films deposited on MgO substrates with an electrode was lower than that of films deposited on sapphire substrates. Laser fluence influenced the grain and crystalline size, resulting in a change in the Ec. Film thicknesses were varied over a range from 0.3 to 2.41μm, with the thinnest film showing a large remanent polarization even at an applied effective voltage of 5V.

Publisher

Springer Science and Business Media LLC

Subject

General Engineering

Reference8 articles.

1. Preparation of epitaxial Pb(ZrxTi1−x)O3thin films and their crystallographic, pyroelectric, and ferroelectric properties

2. Ferroelectric properties of lead‐zirconate‐titanate films prepared by laser ablation

3. Preparation of Pb(Zn0.52Ti0.48)O3Films by Laser Ablation

4. Influence of Laser Fluence on Structural and Ferroelectric Properties of Lead-Zirconate-Titanate Thin Films Prepared by Laser Ablation

5. Preparation and ferroelectric properties of PbZr0.53Ti0.47O3thin films by spin coating and metalorganic decomposition

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