Author:
Zhang Yingjiu,Wang Nanlin,He Rongrui,Zhang Qi,Zhu Jing,Yan Yunjie
Abstract
A reversible bending phenomenon of Si3N4 nanowires on the conductive carbon–formalin microgrid under an illumination of electron beam was observed using a transmission electron microscope. The nanowires exhibit high flexibility. The bending deflection is approximately proportional to the square of the current density (J) of the electron beam. The bending strength of Si3N4 nanowire is much higher than that of bulk Si3N4 materials. The force that bent the nanowires may be an electrostatic force.
Publisher
Springer Science and Business Media LLC
Subject
Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science
Cited by
63 articles.
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