The Influence of Microstructure on Nanomechanical and Diffusion Barrier Properties of Thin PECVD SiOx Films Deposited on Parylene C Substrates
Author:
Publisher
Frontiers Media SA
Subject
Materials Science (miscellaneous)
Reference87 articles.
1. Effect of self-bias voltage on the wettability, chemical functionality and nanomechanical properties of hexamethyldisiloxane films;Albuquerque;Thin Solid Films,2014
2. SiOx surface stoichiometry by XPS: a comparison of various methods;Alfonsetti;Surf. Interface Anal,1994
3. XPS studies on SiOx thin films;Alfonsetti;Appl. Surf. Sci,1993
4. Polymer encapsulants for microelectronics: mechanisms for protection and failure;Anderson;IEEE Trans. Components Hybrids Manuf. Technol,1988
5. On the determination of the Young's modulus of thin films using indentation tests;Antunes;Int. J. Solids Struct,2007
Cited by 8 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Dry fractionation of chickpea flour: Impact of de-oiling and flow aids;Powder Technology;2024-10
2. Hermetic, Hybrid Multilayer, Sub‐5µm‐Thick Encapsulations Prepared with Vapor‐Phase Infiltration of Metal Oxides in Conformal Polymers for Flexible Bioelectronics;Advanced Functional Materials;2024-07
3. Properties of an amorphous crystalline nanopowder Si–SiO2 produced by pulsed electron beam evaporation;Materials Chemistry and Physics;2024-04
4. Recent Advances in Encapsulation of Flexible Bioelectronic Implants: Materials, Technologies, and Characterization Methods;Advanced Materials;2022-07-20
5. MIS-Like Structures with Silicon-Rich Oxide Films Obtained by HFCVD: Their Response as Photodetectors;Sensors;2022-05-21
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3