1. Predicting lower bounds on failure power distributions of silicon NPN transistors;Alexander;IEEE Trans. Nucl. Sci.,1981
2. The impact of technology scaling on the ESD robustness and circuit design;Ameresekera,1994
3. The power to failure model for cylindrical defect;Arkihpov;Int. J. Electr.,1983
4. Semiconductor junction non-linear failure power thresholds: wunsch-bell revisited;Ash,1983
5. Semiconductor device degradation by high amplitude current pulses;Brown;IEEE Trans. Nucl. Sci.,1972