Spectral denoising based on Hilbert–Huang transform combined with F-test

Author:

Bian Xihui,Ling Mengxuan,Chu Yuanyuan,Liu Peng,Tan Xiaoyao

Abstract

Due to the influence of uncontrollable factors such as the environment and instruments, noise is unavoidable in a spectral signal, which may affect the spectral resolution and analysis result. In the present work, a novel spectral denoising method is developed based on the Hilbert–Huang transform (HHT) and F-test. In this approach, the original spectral signal is first decomposed by empirical mode decomposition (EMD). A series of intrinsic mode functions (IMFs) and a residual (r) are obtained. Then, the Hilbert transform (HT) is performed on each IMF and r to calculate their instantaneous frequencies. The mean and standard deviation of instantaneous frequencies are calculated to further illustrate the IMF frequency information. Third, the F-test is used to determine the cut-off point between noise frequency components and non-noise ones. Finally, the denoising signal is reconstructed by adding the IMF components after the cut-off point. Artificially chemical noised signal, X-ray diffraction (XRD) spectrum, and X-ray photoelectron spectrum (XPS) are used to validate the performance of the method in terms of the signal-to-noise ratio (SNR). The results show that the method provides superior denoising capabilities compared with Savitzky–Golay (SG) smoothing.

Funder

Key Lab of Process Analysis and Control of Sichuan Universities of China

State Key Laboratory of Plateau Ecology and Agriculture, Qinghai University

Publisher

Frontiers Media SA

Subject

General Chemistry

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