Synthesis and Characterization of Stannic Oxide (SnO2) Thin Film

Abstract

SnO2 (Stannic oxide) thin films were prepared by atomizing stannic chloride (SnCl4) solution onto microscope slide substrate at 400°C substrate temperature with a simple spray coating device. The samples were examined optically, structurally, morphologically, and compositionally by UV-Vis, XRD, SEM and EDS spectroscopic techniques. Optical analysis showed that the synthesized films had 70–88% transmittance in the visible region and the band gap energy (Eg) value was 3.89 eV. Based on absorbance and transmittance measurements, the wavelength-dependent refractive index distribution of the film was found and its thickness was calculated as 239 nm by the Swanepoel method. XRD studies determined that the films are amorphous structure. FE-SEM micrographs revealed that granular structure with a size of 884 nm, and a film thickness around 287.1-341.8 nm while the EDX analysis indicated the non-stoichiometric structure of the deposited thin films.