Size-Dependent Buckling and Post-Buckling Analysis of the Functionally Graded Thin Plate Al–Cu Material Based on a Modified Couple Stress Theory

Author:

Tang FeixiangORCID,Dong Fang,Guo Yuzheng,Shi Shaonan,Jiang Jize,Liu Sheng

Abstract

Size-dependent functionally graded material thin plate buckling and post-buckling problems are considered using the framework of the MCST (Modified Couple Stress Theory). Based on modified couple stress theory and power law, the post-buckling deflection and critical buckling load of simply supported functionally graded material thin plate are derived using Hamilton’s minimum potential energy principle. The analysis compares the simulation results of linear buckling and nonlinear buckling. Innovatively, a power-law distribution with scale effects is considered. The influences of scale effect parameters l and power-law index parameters k on buckling displacement, load, and strain energy of plates have been investigated. In this article, it is found that the critical buckling displacement, critical buckling load, and buckling strain energy increase with increases in the power-law index parameters k. The membrane energy decreases as the power-law index parameter increases. If the upper and lower layers are swapped, the opposite result is obtained. In comparison, the scale effect parameter is more influential than the power-law exponent. The critical buckling displacement in the x-direction is not affected by scale effects. The critical buckling load, the membrane energy, and buckling strain energy increase as the scale effect parameter increases. Scale effects increase material stiffness compared with traditional theory, and the power-law index parameters affect FGM properties such as elastic modulus, Poisson’s ratio, density, etc. Both scale effects parameters and power-law index parameters have important effects on the mechanical behavior of materials.

Funder

the National Key R&D Program of China

Publisher

MDPI AG

Subject

General Materials Science,General Chemical Engineering

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