Precision Calibration and Linearity Assessment of Thin Film Force-Sensing Resistors

Author:

Jung Jinwoo1ORCID,Lee Kihak2,Kim Bonghwan2ORCID

Affiliation:

1. Department of Robotics Engineering, Daegu Catholic University, Gyeongsan-si 38430, Republic of Korea

2. Department of Semiconductor Electronic Engineering, Daegu Catholic University, Gyeongsan-si 38430, Republic of Korea

Abstract

In this study, we thoroughly analyzed the linearity and repeatability of force-sensing resistor (FSR) sensors through static load tests to ensure their reliability. The novelty of this research lies in its comprehensive evaluation and direct comparison of two widely used FSR sensors, i.e., Flexiforce A201-1 and Interlink FSR-402, under various loading conditions by employing a robust calibration methodology. This study provides detailed insights into the sensors’ performances, offering practical calibration equations that enhance measurement precision and reliability, which have not been extensively documented in previous studies. Our results demonstrate that the linearity of thin film FSR sensors is highly accurate, closely resembling a straight line. We employed M1 Class weights, applying loads ranging from 20 g to 300 g. The resistance of the FSR sensors, which varies with the applied load, was measured using a voltage divider circuit and an analog-to-digital converter of a microcontroller. MATLAB was used to calculate the average output voltage for each applied load and fixed resistance. Additionally, we examined the relationships among load, FSR sensor resistance, and conductivity. Our research indicates that with precise calibration, thin film FSR sensors can be highly reliable for force measurement applications.

Funder

Daegu Catholic University

Publisher

MDPI AG

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