Cascade Analysis Method of Multilayer Optical Films Structure Based on Two Port Transmission Line Theory

Author:

Wen KuiORCID,Huang Xianjun,Liang Yuanlong,Liu Wencong,Xu Yanlin,Liu Peiguo

Abstract

The infrared band is one of the important communication windows. Most of the detectors and sensors working in this band are designed and manufactured based on micro- and nano-lithography technology. In this article, we cut the giant-sized thickness of the transparent substrate and the metal film was uniformly sliced. Then, we used the CST software to simulate the sliced substrate and the metal film to obtain the optical response parameters for each slice. Finally, the combination of metal film and substrate was realized by cascading calculation of the two port transmission line theory, which solves problems such as overlong simulation time and cumbersome running load caused by huge grid divisions due to the difference between the substrate thickness and the response wavelength in the process of simulating light propagation. On the other hand, the cascade analysis method was experimentally verified by constructing a surface plasmon filter in the medium infrared band, which provides an effective idea and solution for bridging the gap between simulation and engineering application.

Funder

the Foundation of Hunan Talents

the Science Foundation of Hunan Province

Publisher

MDPI AG

Subject

Fluid Flow and Transfer Processes,Computer Science Applications,Process Chemistry and Technology,General Engineering,Instrumentation,General Materials Science

Reference23 articles.

1. Controllable linear asymmetric transmission and perfect polarization conversion in a terahertz hybrid metal-graphene metasurface;Zhao;Opt. Express,2019

2. Surface plasmon resonance sensor working at terahertz frequency;Feng;Spectrosc. Spectr.,2011

3. A CMOS-MEMS mirror with curled-hinge comb drives;Xie;J. Microelectromech. Syst.,2003

4. Low-noise MEMS vibration sensor for geophysical applications;Bernstein;J. Microelectromech. Syst.,2002

5. MEMS vertical probe cards with ultra densely arrayed metal probes for wafer-level IC testing;Wang;J. Microelectromech. Syst.,2009

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