Detection of Periapical Lesions on Panoramic Radiographs Using Deep Learning

Author:

Ba-Hattab Raidan1ORCID,Barhom Noha1,Osman Safa1ORCID,Naceur Iheb1,Odeh Aseel1,Asad Arisha1,Al-Najdi Shahd1,Ameri Ehsan2,Daer Ammar3,Silva Renan4ORCID,Costa Claudio4,Cortes Arthur5ORCID,Tamimi Faleh1

Affiliation:

1. College of Dental Medicine, QU Health, Qatar University, Doha 2713, Qatar

2. Faculty of Medicine, University of Montreal, Montreal, QC H3T 1J4, Canada

3. Faculty of Dentistry, McGill University, Montreal, QC H3A 1G1, Canada

4. School of Dentistry, University of Sao Paulo, São Paulo 05508-000, Brazil

5. Faculty of Dental Surgery, University of Malta, MSD 2080 Msida, Malta

Abstract

Dentists could fail to notice periapical lesions (PLs) while examining panoramic radiographs. Accordingly, this study aimed to develop an artificial intelligence (AI) designed to address this problem. Materials and methods: a total of 18618 periapical root areas (PRA) on 713 panoramic radiographs were annotated and classified as having or not having PLs. An AI model consisting of two convolutional neural networks (CNNs), a detector and a classifier, was trained on the images. The detector localized PRAs using a bounding-box-based object detection model, while the classifier classified the extracted PRAs as PL or not-PL using a fine-tuned CNN. The classifier was trained and validated on a balanced subset of the original dataset that included 3249 PRAs, and tested on 707 PRAs. Results: the detector achieved an average precision of 74.95%, while the classifier accuracy, sensitivity and specificity were 84%, 81% and 86%, respectively. When integrating both detection and classification models, the proposed method accuracy, sensitivity, and specificity were 84.6%, 72.2%, and 85.6%, respectively. Conclusion: a two-stage CNN model consisting of a detector and a classifier can successfully detect periapical lesions on panoramic radiographs.

Publisher

MDPI AG

Subject

Fluid Flow and Transfer Processes,Computer Science Applications,Process Chemistry and Technology,General Engineering,Instrumentation,General Materials Science

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