Construct the Optimum Process Model for Transistor Gaskets with Six-Sigma DMAIC

Abstract

The improvement process of six-sigma DMAIC refers to the process that the industry performs to enhance process quality via the following five procedures: (1) define, (2) measure, (3) analyze, (4) improve, and (5) control. It is a common tool used in the industry to ameliorate and enhance process quality. In addition, the process capability index is a tool that the industry most frequently uses to measure process quality. Though many studies have discussed six-sigma methods, none of the specific theoretical models could be provided as a reference for the above five DMAIC improvement steps, making it difficult to control the effect. In order to solve this problem, this paper developed the multi-characteristic process capability analysis chart, MPCAC, using the process capability index and applied the method of statistical inference as a tool promoting define, measure, and analyze in the improvement process of six-sigma DMAIC. Additionally, the testing of the orthogonal table in the Taguchi method can efficiently assist process engineers in finding the optimum combination of machining parameters to improve or boost the process quality level of the quality characteristics by reducing the number and the cost of experiments. Therefore, this paper then adopted the testing of the orthogonal table in the Taguchi method as a tool for process improvement in the fourth step. Finally, according to the optimal combination of machining parameters improved in the fourth step, a standard operating procedure for transistor gaskets was established as a tool for process control in the fifth step.