A Simplified Measurement Configuration for Evaluation of Relative Permittivity Using a Microstrip Ring Resonator with a Variational Method-Based Algorithm

Abstract

In this paper, we present a simple yet efficient method for determination of the relative permittivity of thin dielectric materials. An analysis that led to definition of the proper size and placement of a sample under test (SUT) on the surface of a microstrip ring resonator (MRR) was presented based on the full-wave simulations and measurements on benchmark materials. For completeness, the paper includes short descriptions of the design of an MRR and the variational method-based algorithm that processes the measured values. The efficiency of the proposed method is demonstrated on 12 SUT materials of different thicknesses and permittivity values, and the accuracy between 0% and 10% of the relative error was achieved for all SUTs thinner than 2 mm.