Micrometric Growth Defects of DLC Thin Films

Abstract

Defects in diamond-like carbon coatings deposited on corrosion sensitive 100Cr6 steel have been studied. Diamond-like carbon (DLC) thin films are promising for corrosion protection due to chemical inertness and low electrical conductivity. Nevertheless, the performance of these coating is highly sensitive to the presence of uncoated areas. These defects represent the primary way of substrate degradation in aggressive environments. An in situ optical microscopy coupled to an electrochemical activation was developed to reveal micrometric growth defects and observe that they were at the origin of corrosion. A square wave voltammetry was applied to increase the sensitivity of electrochemical techniques based on the detection of the dissolution of the bare metal surface triggered by the presence of uncoated spots. This method can be utilized to quantify defect density arising from vapor deposition processes.