Accelerated Life Testing of a Palladium-Doped Tin Oxide Electrode for Zn Electrowinning

Author:

Park Jung Eun,Kim Ho,Lee Eun Sil

Abstract

Electrowinning is a technique that can be used to obtain high-purity elements through electrolysis. The degradation of accelerated life testing for Pd-based electrodes is discussed in this study. The lifetime of the electrodes was examined by multiplying the acceleration rate with the current to measure the voltage of the electrodes. The acceleration rate was set to 10, 20, and 30 times. Four components were deposited on the TiO2 plate. The ratio of Ir to Sn was fixed at 1:1, while Ta was deposited at 10 wt.%. Pd was deposited at 2, 4, 8 and 10 wt.% to create Pd-Ir/Sn-Ta. The initial voltage decreased as the Pd deposition amount increased irrespective of the acceleration rate. The lower the acceleration rate, the lower the voltage. An increase in the Pd content caused the initial voltage to be low. The multiple of the acceleration rate slightly increased for all cases of life testing for one year. When the test was conducted by increasing the current density by 20 times, the increase in voltage was proportional to the Pd deposition amount. However, for the 30 times acceleration rate, the lifetime of the electrodes was shortened as the Pd content increased. It can be inferred that the content of Pd and the ratio of Ir to Sn can influence the lifetime of the electrodes. According to these results, if the multiple of the acceleration rate is too extreme, the lifetime of the electrodes cannot be evaluated because they are damaged in an extreme situation.

Publisher

MDPI AG

Subject

General Materials Science

Cited by 1 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号  京ICP备18003416号-3