Hand and Abrasive Flow Polished Tungsten Carbide Die: Optimization of Surface Roughness, Polishing Time and Comparative Analysis in Wire Drawing

Author:

Kumar RamanORCID,Singh Sehijpal,Aggarwal Vivek,Singh SunpreetORCID,Pimenov Danil YurievichORCID,Giasin KhaledORCID,Nadolny KrzysztofORCID

Abstract

This research work highlights the benefits of abrasive flow polishing (AFP) applied to tungsten carbide dies compared with conventional hand polishing (HP). An indigenous experimental set-up for AFP was developed. The effect of prominent process parameters viz. extrusion pressure, number of cycles, and abrasive particle concentration on the final surface roughness, percentage improvement in surface roughness, and polishing time was investigated by Taguchi-designed experiments. The multi-objective optimization (MOO) was performed using the Taguchi-TOPSIS-Equal weight approach to find the respective optimized AFP parametric settings. A set of skilled operators performed the conventional HP of dies, and the best hand-polished (HPed) die was selected using the TOPSIS technique. The operational performance of the HPed dies and the abrasive flow polished (AFPed) dies were compared on the three-stage wire drawing operation. The results revealed that AFP’s surface resulted in a better-quality surface than hand polishing with a 27.06% improvement in surface roughness. Furthermore, AFP can reduce the dependency on costly and tricky-to-locate skilled operators, with a reasonable amount of time saving (about 87.05%). Overall, the study’s findings show that abrasive flow polishing of dies is fast and cost-effective.

Publisher

MDPI AG

Subject

General Materials Science

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