A Study on the Fault Location of Secondary Equipment in Smart Substation Based on the Graph Attention Network

Author:

Xiang Xian-Ming12,Dong Xiu-Cheng12,He Jin-Qing1,Zheng Yong-Kang3ORCID,Li Xin-Yang1

Affiliation:

1. Sichuan University Jinjiang College, Meishan 620860, China

2. School of Electrical & Electronic Information, Xihua University, Chengdu 610039, China

3. State Grid Sichuan Electric Power Research Institute, Chengdu 610099, China

Abstract

The inability to locate device faults quickly and accurately has become prominent due to the large number of communication devices and the complex structure of secondary circuit networks in smart substations. Traditional methods are less efficient when diagnosing secondary equipment faults in smart substations, and deep learning methods have poor portability, high learning sample costs, and often require retraining a model. Therefore, a secondary equipment fault diagnosis method based on a graph attention network is proposed in this paper. All fault events are automatically represented as graph-structured data based on the K-nearest neighbors (KNNs) algorithm in terms of the feature information exhibited by the corresponding detection nodes when equipment faults occur. Then, a fault diagnosis model is established based on the graph attention network. Finally, partial intervals of a 220 kV intelligent substation are taken as an example to compare the fault localization effect of different methods. The results show that the method proposed in this paper has the advantages of higher localization accuracy, lower learning cost, and better robustness than the traditional machine learning and deep learning methods.

Funder

National Natural Science Foundation of China

Sichuan Provincial Special Project for Guiding Local Science and Technology Development

Siwei Hi-Tech—Xihua University Joint Laboratory of Industry–University Research

Publisher

MDPI AG

Subject

Electrical and Electronic Engineering,Biochemistry,Instrumentation,Atomic and Molecular Physics, and Optics,Analytical Chemistry

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