Investigation of Sm Addition on Microstructural and Optical Properties of CoFe Thin Films

Author:

Liu Wen-Jen1,Chang Yung-Huang2,Chiang Chia-Chin3ORCID,Lai Jian-Xin4,Chen Yuan-Tsung4ORCID,Chen Hsiung-Liang4,Lin Shih-Hung5ORCID

Affiliation:

1. Department of Materials Science and Engineering, I-Shou University, Kaohsiung 840, Taiwan

2. Bachelor Program in Industrial Technology, National Yunlin University of Science and Technology, 123 University Road, Section 3, Douliou, Yunlin 640301, Taiwan

3. Department of Mechanical Engineering, National Kaohsiung University of Science and Technology, Kaohsiung City 80778, Taiwan

4. Graduate School of Materials Science, National Yunlin University of Science and Technology, 123 University Road, Section 3, Douliou, Yunlin 640301, Taiwan

5. Department of Electronic Engineering, National Yunlin University of Science and Technology, 123 University Road, Section 3, Douliou, Yunlin 640301, Taiwan

Abstract

CoFe-based alloys and rare earth (RE) elements are among the most studied materials in applying magnetic devices to improve soft magnetic characteristics. A series of Co40Fe40Sm20 films are deposited on a glass substrate via the sputtering technique, followed by an annealing process to investigate their effect on microstructural and optical properties of Co40Fe40Sm20 films. In this study, the increase in the thickness of Co40Fe40Sm20 films and annealing temperatures resulted in a smoother surface morphology. The 40 nm Co40Fe40Sm20 films annealed 300 °C are expected to have good wear resistance and adhesive properties due to their high values of H/E ratio and surface energy. Optical transparency also increased due to the smoother surface of the Co40Fe40Sm20 films.

Funder

National Science Council

National Yunlin University of Science and Technology

Publisher

MDPI AG

Subject

General Materials Science

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