Phase Deflectometry for Defect Detection of High Reflection Objects

Author:

Cheng Xian-Ming1,Wang Ting-Ting1ORCID,Zhu Wen-Bin1,Shi Bai-Di1,Chen Wei1

Affiliation:

1. College of Mechanical and Electrical Engineering, Hohai University, Changzhou 213022, China

Abstract

A method for detecting the surface defects of high reflection objects using phase deflection is proposed. The abrupt change in the surface gradient at the defect leads to the change in the fringe phase. Therefore, Gray code combined with a four-step phase-shift method was employed to obtain the surface gradients to characterize the defects. Then, through the double surface illumination model, the relationship between illumination intensity and phase was established. The causes of periodic error interference were analyzed, and the method of adjusting the fringe width to eliminate it was proposed. Finally, experimental results showed the effectiveness of the proposed method.

Funder

National Natural Science Foundation of China

Changzhou Science and Technology Support & Social Development Project

Publisher

MDPI AG

Subject

Electrical and Electronic Engineering,Biochemistry,Instrumentation,Atomic and Molecular Physics, and Optics,Analytical Chemistry

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