Anomaly Detection in Annular Metal Turning Surfaces Based on a Priori Information and a Multi-Scale Self-Referencing Template

Author:

Suo Xinyu1ORCID,Zhang Jie1,Liu Jian1,Yang Dezhi1,Zhou Feitao1

Affiliation:

1. State Key Laboratory of Advanced Design and Manufacture for Vehicle Body, Hunan University, Changsha 410082, China

Abstract

To solve the problem of anomaly detection in annular metal turning surfaces, this paper develops an anomaly detection algorithm based on a priori information and a multi-scale self-referencing template by combining the imaging characteristics of annular workpieces. First, the annular metal turning surface is unfolded into a rectangular expanded image using bilinear interpolation to facilitate subsequent algorithm development. Second, the grayscale information from the positive samples is used to obtain the a priori information, and a multi-scale self-referencing template method is used to obtain its own multi-scale information. Then, the phase error and large-size anomaly interference problems of the self-referencing method are overcome by combining the a priori information with its own information, and an accurate response to anomalous regions of various sizes is realized. Finally, the segmentation completeness of the anomalous region is improved by utilizing the region growing method. The experimental results show that the proposed method achieves a mean pixel AUROC of 0.977, and the mean M_IOU of segmentation reaches 0.788. In terms of efficiency, this method is also much more efficient than the commonly used anomaly detection algorithms. The proposed method can achieve rapid and accurate detection of defects in annular metal turning surfaces and has good industrial application value.

Funder

the China–Japan Science and Technology Joint Committee of the Ministry of Science and Technology of the People’s Republic of China

Key Research and Development Program of Hunan Province

the program of Leading Scientific and Technological Innovation in High-Tech Industries

Publisher

MDPI AG

Subject

Electrical and Electronic Engineering,Biochemistry,Instrumentation,Atomic and Molecular Physics, and Optics,Analytical Chemistry

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