Open-Path Cavity Ring-Down Spectroscopy for Simultaneous Detection of Hydrogen Chloride and Particles in Cleanroom Environment

Author:

Khan Muhammad Bilal1,L’Orange Christian1ORCID,Lim Cheongha2,Kwon Deokhyeon2,Yalin Azer P.1ORCID

Affiliation:

1. Department of Mechanical Engineering, Colorado State University, Fort Collins, CO 80525, USA

2. Pyeongtaek Infra Analysis Group, Infra Analysis Team, Samsung Electronics, Pyeongtaek-si 17786, Republic of Korea

Abstract

The present study addresses advanced monitoring techniques for particles and airborne molecular contaminants (AMCs) in cleanroom environments, which are crucial for ensuring the integrity of semiconductor manufacturing processes. We focus on quantifying particle levels and a representative AMC, hydrogen chloride (HCl), having known detrimental effects on equipment longevity, product yield, and human health. We have developed a compact laser sensor based on open-path cavity ring-down spectroscopy (CRDS) using a 1742 nm near-infrared diode laser source. The sensor enables the high-sensitivity detection of HCl through absorption by the 2-0 vibrational band with an Allan deviation of 0.15 parts per billion (ppb) over 15 min. For quantifying particle number concentrations, we examine various detection methods based on statistical analyses of Mie scattering-induced ring-down time fluctuations. We find that the ring-down distributions’ 3rd and 4th standard moments allow particle detection at densities as low as ~105 m−3 (diameter > 1 μm). These findings provide a basis for the future development of compact cleanroom monitoring instrumentation for wafer-level monitoring for both AMC and particles, including mobile platforms.

Funder

Samsung Electronics Corporation

Publisher

MDPI AG

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