Design and Testing of a Low-Tech DEW Generator for Determining Electromagnetic Immunity of Standard Electronic Circuits

Abstract

This article describes the effect of high-power electromagnetic environments (HPEMs) on the operation of all basic elements of electrical power networks. Frequency bands are defined for the HPEM environments. Attention is focused particularly on directed energy weapons (DEWs) and intentional electromagnetic interference (IEMI). A classification of DEW and IEMI generators in terms of E-field level and target distance from the DEW or IEMI generator antenna aperture is also described. The main focus of this article is on the design and testing of a low-tech DEW generator used to determine the electromagnetic immunity of standard electronic circuits. In addition, verification of electromagnetic immunity for a simple electronic circuit without adequate protection against the E-field is also explained. The outcome of this article is the determination of the E-field limits for fault-free operation, for malfunctioning states of the tested circuits and for irreversible destruction of the circuits. The measured E-field was compared to basic microwave radiation theory and to simulation results in COMSOL Multiphysics software (COMSOL, Inc. 100 District Avenue Burlington, MA 01803 USA).