Evaluating Stresses in SiO2 Thin Films Using Molecular Dynamics Simulations

Author:

Shendokar Sachin1ORCID,Ingle Nikhil1,Mohan Ram1,Aravamudhan Shyam1ORCID

Affiliation:

1. Joint School of Nanoscience and Nanoengineering, NCA&TSU, Greensboro, NC 27401, USA

Publisher

MDPI

Reference9 articles.

1. PECVD grown SiO2 film process optimization;Ping;Silicon Photonics VI,2011

2. Mackenzie, K.D., Johnson, D.J., DeVre, M.W., Westerman, R.J., and Reelfs, B.H. (2005, January 15–20). Stress control of Si-based PECVD dielectrics. Proceedings of the 207th Electrochemical Society Meeting, Quebec, QC, Canada.

3. (2023, October 12). BIOVIA Materials Studio. Available online: https://www.3ds.com/products/biovia/materials-studio.

4. (2023, October 12). SiO₂ mp-6930. Available online: https://next-gen.materialsproject.org/materials/mp-6930#properties.

5. Oxygen interactions with silica surfaces: Coupled cluster and density functional investigation and the development of a new ReaxFF potential;Kulkarni;J. Phys. Chem. C,2013

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