Short Communication: Spatial Dependence Analysis as a Tool to Detect the Hidden Heterogeneity in a Kenaf Field

Author:

Jang Gyujin12ORCID,Kim Dong-Wook1,Kim Hak-Jin1,Chung Yong Suk3ORCID

Affiliation:

1. Department of Biosystems and Biomaterials Engineering, Seoul National University, Seoul 08826, Republic of Korea

2. Integrated Major in Global Smart Farm, Seoul National University, Seoul 08826, Republic of Korea

3. Departement of Plant Resources and Environment, Jeju National University, Jeju 63243, Republic of Korea

Abstract

Ever since research attention was first paid to phenomics, it has mainly focused on the use of high throughput phenotyping for characterizing traits in an accurate and fast manner. It was recently realized that its use has huge potential in precision agriculture. However, the focus so far has mainly been on ”obtain large data set”, not on “how to analyze them”. Here, the expanded application of high throughput phenotyping combined with special dependence analysis is demonstrated to reveal the hidden field heterogeneity, using a kenaf field. Based on the method used in the study, the results showed that the growth of kenaf in the field was grouped into two, which led to a large variation of sources among replications. This method has potential to be applied to detect hidden heterogeneity, to be utilized and applied in plant breeding not only for better analysis, but also for better management of fields in precision agriculture.

Funder

Rural Development Administration, Republic of Korea

Publisher

MDPI AG

Subject

Agronomy and Crop Science

Cited by 2 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号  京ICP备18003416号-3