An Interleaved Segmented Spectrum Analysis: A Measurement Technique for System Frequency Response and Fault Detection

Abstract

A frequency spectrum segmentation methodology is proposed to extract the frequency response of circuits and systems with high resolution and low distortion over a wide frequency range. A high resolution is achieved by implementing a modified Dirichlet function (MDF) configured for multi-tone excitation signals. Low distortion is attained by limiting or avoiding spectral leakage and interference into the frequency spectrum of interest. The use of a window function allowed for further reduction in distortion by suppressing system-induced oscillations that can cause severe interference while acquiring signals. This proposed segmentation methodology with the MDF generates an interleaved frequency spectrum segment that can be used to measure the frequency response of the system and can be represented in a Bode and Nyquist plot. The ability to simulate and measure the frequency response of the circuit and system without expensive network analyzers provides good stability coverage for reliable fault detection and failure avoidance. The proposed methodology is validated with both simulation and hardware.