Fit Accuracy of Cobalt–Chromium and Polyether Ether Ketone Prosthetic Frameworks Produced Using Digital Techniques: In Vitro Pilot Study

Author:

Barbosa Lara1,Figueiral Maria Helena2ORCID,Neves Cristina Bettencourt3ORCID,Malheiro Rodrigo4,Sampaio-Fernandes Manuel António1ORCID,Oliveira Susana João1,Sampaio-Fernandes Maria Margarida2ORCID

Affiliation:

1. Department of Prosthodontics, Faculdade de Medicina Dentária, Universidade do Porto (FMDUP), 4200-393 Porto, Portugal

2. Instituto de Ciência e Inovação em Engenharia Mecânica e Engenharia Industrial (INEGI), Faculdade de Medicina Dentária, Universidade do Porto (FMDUP), 4200-393 Porto, Portugal

3. Biomedical and Oral Sciences Research Unit (UICOB), Faculdade de Medicina Dentária, Universidade de Lisboa (FMDUL), 1600-277 Lisboa, Portugal

4. DigiTech, Faculdade de Medicina Dentária, Universidade de Lisboa (FMDUL), 1600-277 Lisboa, Portugal

Abstract

This pilot study aimed to compare the fit accuracy of cobalt–chromium (Co-Cr) and polyether ether ketone (PEEK) removable partial denture frameworks, produced by digital technologies. Two study models of previously prepared Kennedy’s Class I and Class III mandibular dental arches were scanned. For each model, two frameworks were digitally designed and manufactured using a Co-Cr alloy via the selective laser melting (SLM) technique, and using PEEK via the milling technique. A qualitative assessment of the framework’s fit accuracy to the corresponding study models was carried out using calibrated endodontic instruments and image amplification. Best-fit superimpositions between the reference design and the scanned frameworks were performed using the Geomagic Control X version 2018, 3D Systems software, allowing the expression of trueness by calculating the root mean square (RMS) value. Higher fit accuracy was observed for the milled frameworks, with the Class I PEEK framework showing the best fit accuracy to the corresponding model. RMS values were Class I—148.3 μm for Co-Cr and 69.2 μm for PEEK; Class III—107.2 μm for Co-Cr and 59.7 μm for PEEK. In the experimental conditions used, the milled PEEK frameworks showed better fit accuracy and higher trueness than the SLM-printed Co-Cr ones in both Kennedy classes.

Publisher

MDPI AG

Subject

Fluid Flow and Transfer Processes,Computer Science Applications,Process Chemistry and Technology,General Engineering,Instrumentation,General Materials Science

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