Fatigue Crack Growth in a Monocrystal and Its Similarity to Short-Crack Propagation in a Polycrystal of Nickel

Author:

Petel Avihai1,Jager Ales2,Babai Dotan3ORCID,Jopp Juergen4,Bussiba Arie5,Perl Mordechai1,Shneck Roni Z.3ORCID

Affiliation:

1. Department of Mechanical Engineering, Ben Gurion University of the Negev, Beer Sheva P.O. Box 653, Israel

2. Department of Mechanics, Faculty of Civil Engineering, Czech Technical University in Prague, Thkurova 7, 166 29 Prague, Czech Republic

3. Department of Materials Engineering, Ben Gurion University of the Negev, Beer Sheva P.O. Box 653, Israel

4. Ilse Katz Institute for Nanoscale Science & Technology, Ben Gurion University of the Negev, Beer Sheva P.O. Box 653, Israel

5. Nuclear Research Center Negev, Beer Sheva P.O. Box 9001, Israel

Abstract

Short fatigue cracks in polycrystalline materials are very important from both practical and basic aspects, yet they are very difficult to observe. Therefore, it is suggested to emulate some properties of short cracks with long fatigue cracks in monocrystals. Indeed, such experiments in pure nickel crystals prove that the three peculiar properties of short fatigue cracks in polycrystalline metals are observed in long cracks in monocrystals, i.e., a lower threshold of the stress intensity factor (ΔKI)th, a higher crack propagation rate at low ΔKI regimes, and the fact that different cracks exhibit different growth behaviors. The fatigue experiments in monocrystals reveal interesting details of the slip activity at the front of fatigue cracks, including a selection rule for the active slip systems above and below the crack, the slip behavior under conditions of steep strain gradients, and the activation of a new slip system.

Publisher

MDPI AG

Subject

General Materials Science,Metals and Alloys

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4. The fracture mechanics similitude concept: Questions concerning application to the behavior of short fatigue cracks;Ritchie;Mater. Sci. Eng.,1983

5. Behavior of Small Fatigue Cracks. Fatigue and Fracture;McClung;ASM Handbook,1996

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