Climatically Accelerated Material Processes Determining the Long-Term Reliability of Light-Emitting Diodes

Author:

Harsanyi Gabor1ORCID,Poppe Andras2,Hegedüs Janos2,Hantos Gusztav2,Bojta Peter1,Kovacs Robert3

Affiliation:

1. Department of Electronics Technolgy, Budapest University of Technology and Economics, 3. Műegyetem rkp., 1111 Budapest, Hungary

2. Department of Electron Devices, Budapest University of Technology and Economics, 3. Műegyetem rkp., 1111 Budapest, Hungary

3. EFI-Labs Electronic Failure Analysis Ltd., 18. Egry J. u., 1111 Budapest, Hungary

Abstract

LEDs (Light-Emitting Diodes) are widely applied not only in decorative illumination but also in everyday lighting in buildings, flats, public areas, and automotive fields. These application areas often mean harsh environments, for example, regarding the humidity content of the surrounding air: besides outdoor and automotive illumination, even the household use cases (kitchen, bathroom, cellar) may represent extreme temperature and humidity variations (often reaching relative humidity levels close to 100%) for these devices; thus, their reliability behaviour in such circumstances should be better understood. Thermally activated processes were studied in several previous publications, but less information is available regarding high-humidity environmental tests. Moisture and temperature ageing tests with appropriate environmental parameter settings were performed as accelerated lifetime tests to investigate not only the effect of temperature but also that of humidity on the ageing and reliability of LED packages containing RGB (red green blue) chips and phosphor-converted white (pcW) LEDs. The ageing was followed not only through monitoring optical/electrical/spectral parameters but also with material analysis. Moisture–material interaction models were proposed and set up. It was found that humidity-accelerated ageing processes are more severe than expected from previous assumptions. RGB and pcW LEDs showed strongly different behaviour.

Publisher

MDPI AG

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号  京ICP备18003416号-3