On-Machine LTS Integration for Layer-Wise Surface Quality Characterization in MEX/P

Author:

Fernández Alejandro1ORCID,Zapico Pablo1ORCID,Blanco David1ORCID,Peña Fernando1ORCID,Beltrán Natalia1ORCID,Mateos Sabino1ORCID

Affiliation:

1. Department of Construction and Manufacturing Engineering, University of Oviedo, 33203 Gijón, Asturias, Spain

Abstract

Material Extrusion (MEX) currently stands as the most widespread Additive Manufacturing (AM) process, but part quality deficiencies remain a barrier to its generalized industrial adoption. Quality control in MEX is a complex task as extrusion performance impacts the consistency of mechanical properties and the surface finish, dimensional accuracy, and geometric precision of manufactured parts. Recognizing the need for early-stage process monitoring, this study explores the potential of integrating Laser Triangulation Sensors (LTS) into MEX/P manufacturing equipment for layer-wise 3D inspections. Using a double-bridge architecture, an LTS-based sub-micrometric inspection system operates independently from the manufacturing process, enabling comprehensive digitization and autonomous reconstruction of the target layer’s topography. Surface texture is then computed using standardized indicators and a new approach that provides insight into layer quality uniformity. A case study evaluating two alternative extruder head designs demonstrates the efficacy of this integrated approach for layer quality characterization. Implementing a generalized layer-wise procedure based on this integration can significantly mitigate quality issues in MEX manufacturing and optimize process parameter configurations for enhanced performance.

Funder

Spanish Ministry of Science, Innovation and Universities; FEDER

Publisher

MDPI AG

Reference48 articles.

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