Evaluation of the Radiation Shielding Properties of a Tellurite Glass System Modified with Sodium Oxide

Abstract

In this study, the X-ray and gamma attenuation characteristics and optical properties of a synthesized tellurite–phosphate–sodium oxide glass system with a composition of (85 − x)TeO2–10P2O5–xNa2O mol% (where x = 15, 20, and 25) were evaluated. The glass systems we re fabricated by our research group using quenching melt fabrication. The shielding parameters of as-synthesized systems, such as the mass attenuation coefficient (MAC), linear attenuation coefficient (LAC), effective atomic number (Zeff), half-value layer (HVL), tenth value layer (TVL), mean free path (MFP), and effective electron density (Neff) in a wide energy range between 15 keV and 15 MeV, were estimated using well-known PHY-X/PSD software and recently developed MIKE software. Herein, the optical parameters of prepared glasses, such as molar volume (VM), oxygen molar volume (VO), oxygen packing density (OPD), molar polarizability (αm), molar refractivity (Rm), reflection loss (RL), and metallization (M), were estimated using MIKE software. Furthermore, the shielding performance of the prepared glasses was compared with that of commonly used standard glass shielding materials. The results show that the incorporation of sodium oxide into the matrix TeO2/P2O5 with an optimum concentration can yield a glass system with good shielding performance as well as good optical and physical properties, especially at low photon energy.