A Digital Improvement—Trimming a Digital Temperature Sensor with EEPROM Reprogrammable Fuses

Author:

Vasile (Dragan) Anca MihaelaORCID,Negut Alina,Tache Adrian,Brezeanu Gheorghe

Abstract

An EEPROM (electrically erasable programmable read-only memory) reprogrammable fuse for trimming a digital temperature sensor is designed in a 0.18-µm CMOS EEPROM. The fuse uses EEPROM memory cells, which allow multiple programming cycles by modifying the stored data on the digital trim codes applied to the thermal sensor. By reprogramming the fuse, the temperature sensor can be adjusted with an increased trim variation in order to achieve higher accuracy. Experimental results for the trimmed digital sensor showed a +1.5/−1.0 ℃ inaccuracy in the temperature range of −20 to 125 ℃ for 25 trimmed DTS samples at 1.8 V by one-point calibration. Furthermore, an average mean of 0.40 ℃ and a standard deviation of 0.70 ℃ temperature error were obtained in the same temperature range for power supply voltages from 1.7 to 1.9 V. Thus, the digital sensor exhibits similar performances for the entire power supply range of 1.7 to 3.6 V.

Publisher

MDPI AG

Subject

Electrical and Electronic Engineering,Biochemistry,Instrumentation,Atomic and Molecular Physics, and Optics,Analytical Chemistry

Reference35 articles.

1. Datasheet of N34TS04 Circuithttps://www.onsemi.com/pub/Collateral/N34TS04-D.PDF

2. Datasheet of N34TS108 Circuithttps://www.onsemi.com/pub/Collateral/N34TS108-D.PDF

3. A 1770-$\mu$ m2 Leakage-Based Digital Temperature Sensor With Supply Sensitivity Suppression in 55-nm CMOS

4. A CMOS-Imager-Pixel-Based Temperature Sensor for Dark Current Compensation

Cited by 4 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. A Digital Trimming Circuit with Pre-Trimming Function;2024 IEEE 4th International Conference on Power, Electronics and Computer Applications (ICPECA);2024-01-26

2. Design and Implementation of Test System for System Chip Function Test;2023 3rd International Conference on Electronic Information Engineering and Computer Communication (EIECC);2023-12-22

3. In Focus: Data Hold Time for Temperature Sensors with High Speed I2C Interface;2023 International Semiconductor Conference (CAS);2023-10-11

4. Tutorial on Resistor Trimming;Solid State Electronics Letters;2021-12

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号  京ICP备18003416号-3