Comparison of Different Machine Learning Algorithms for the Prediction of the Wheat Grain Filling Stage Using RGB Images

Abstract

Grain filling is essential for wheat yield formation, but is very susceptible to environmental stresses, such as high temperatures, especially in the context of global climate change. Grain RGB images include rich color, shape, and texture information, which can explicitly reveal the dynamics of grain filling. However, it is still challenging to further quantitatively predict the days after anthesis (DAA) from grain RGB images to monitor grain development. Results: The WheatGrain dataset revealed dynamic changes in color, shape, and texture traits during grain development. To predict the DAA from RGB images of wheat grains, we tested the performance of traditional machine learning, deep learning, and few-shot learning on this dataset. The results showed that Random Forest (RF) had the best accuracy of the traditional machine learning algorithms, but it was far less accurate than all deep learning algorithms. The precision and recall of the deep learning classification model using Vision Transformer (ViT) were the highest, 99.03% and 99.00%, respectively. In addition, few-shot learning could realize fine-grained image recognition for wheat grains, and it had a higher accuracy and recall rate in the case of 5-shot, which were 96.86% and 96.67%, respectively. Materials and Methods: In this work, we proposed a complete wheat grain dataset, WheatGrain, which covers thousands of wheat grain images from 6 DAA to 39 DAA, which can characterize the complete dynamics of grain development. At the same time, we built different algorithms to predict the DAA, including traditional machine learning, deep learning, and few-shot learning, in this dataset, and evaluated the performance of all models. Conclusions: To obtain wheat grain filling dynamics promptly, this study proposed an RGB dataset for the whole growth period of grain development. In addition, detailed comparisons were conducted between traditional machine learning, deep learning, and few-shot learning, which provided the possibility of recognizing the DAA of the grain timely. These results revealed that the ViT could improve the performance of deep learning in predicting the DAA, while few-shot learning could reduce the need for a number of datasets. This work provides a new approach to monitoring wheat grain filling dynamics, and it is beneficial for disaster prevention and improvement of wheat production.