A Review of Three-Dimensional Scanning Near-Field Optical Microscopy (3D-SNOM) and Its Applications in Nanoscale Light Management-Reference-Cited by-同舟云学术

A Review of Three-Dimensional Scanning Near-Field Optical Microscopy (3D-SNOM) and Its Applications in Nanoscale Light Management

Published:2017-09-22 Issue:10 Volume:7 Page:973
ISSN:2076-3417
Container-title:Applied Sciences
language:en
Short-container-title:Applied Sciences

Author:

Bazylewski Paul,Ezugwu Sabastine,Fanchini Giovanni^ORCID

Publisher

MDPI AG

Subject

Fluid Flow and Transfer Processes,Computer Science Applications,Process Chemistry and Technology,General Engineering,Instrumentation,General Materials Science

Link

http://www.mdpi.com/2076-3417/7/10/973/pdf

Reference62 articles.

1. Light microscopy: an ongoing contemporary revolution

2. Toward fluorescence nanoscopy

3. Full-field swept-source phase microscopy

4. High-resolution full-field optical coherence tomography with a Linnik microscope

5. Full-Field Optical Coherence Tomography Using Galvo Filter-Based Wavelength Swept Laser

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