A Composite Velocity Map Imaging Spectrometer for Ions and 1 keV Electrons at the Shanghai Soft X-ray Free-Electron Laser

Author:

Ding Bocheng,Xu WeiqingORCID,Wu Ruichang,Feng Yunfei,Tian Lifang,Li Xiaohong,Huang Jianye,Liu Zhi,Liu XiaojingORCID

Abstract

Velocity map imaging (VMI) spectrometry is widely used to measure the momentum distribution of charged particles with the kinetic energy of a few tens of electronVolts. With the progress of femtosecond laser and X-ray free-electron laser, it becomes increasingly important to extend the electron kinetic energy to 1 keV. Here, we report on a recently built composite VMI spectrometer at the Shanghai soft X-ray free-electron laser, which can measure ion images and high-energy electron images simultaneously. In the SIMION simulation, we extended the electron kinetic energy to 1 keV with a resolution <2% while measuring the ions with the kinetic energy of 20 eV. The experimental performance is tested by measuring Ar 2p photoelectron spectra at Shanghai Synchrotron Radiation Facility, and O+ kinetic energy spectrum from dissociative ionization of O2 by 800 nm femtosecond laser. We reached a resolution of 1.5% at the electron kinetic energy of 500 eV. When the electron arm is set for 100 eV, a resolution of 4% is reached at the ion kinetic energy of 5.6 eV. This composite VMI spectrometer will support the experiment, such as X-ray multi-photon excitation/ionization, Auger electrons emission, attosecond streaking.

Funder

National Natural Science Foundation of China

Publisher

MDPI AG

Subject

Fluid Flow and Transfer Processes,Computer Science Applications,Process Chemistry and Technology,General Engineering,Instrumentation,General Materials Science

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