Four-Layer Surface Plasmon Resonance Structures with Amorphous As2S3 Chalcogenide Films: A Review

Abstract

The paper is a review of surface plasmon resonance (SPR) structures containing amorphous chalcogenide (ChG) films as plasmonic waveguides. The calculation method and specific characteristics obtained for four-layer SPR structures containing films made of amorphous As2S3 and As2Se3 are presented. The paper is mainly based on our previously obtained and published scattered results, to which a generalized point of view was applied. In our analysis, we demonstrate that, through proper choice of the SPR structure layer parameters, we can control the resonance angle, the sharpness of the SPR resonance curve, the penetration depth, and the sensitivity to changes in the refractive index of the analyte. These results are obtained by operating with the thickness of the ChG film and the parameters of the coupling prism. Aspects regarding the realization of the coupling prism are discussed. Two distinct cases are analyzed: first, when the prism is made of material with a refractive index higher than that of the waveguide material; second, when the prism is made of material with a lower refractive index. We demonstrated experimentally that the change in reflectance self-induced by the modification in As2S3 refractive index exhibits a hysteresis loop. We present specific results regarding the identification of alcohols, hydrocarbons, and the marker of E. coli bacteria.