Thickness Dependence of Switching Behavior in Ferroelectric BiFeO3 Thin Films: A Phase-Field Simulation-Reference-Cited by-同舟云学术

Thickness Dependence of Switching Behavior in Ferroelectric BiFeO3 Thin Films: A Phase-Field Simulation

Published:2017-11-13 Issue:11 Volume:7 Page:1162
ISSN:2076-3417
Container-title:Applied Sciences
language:en
Short-container-title:Applied Sciences

Author:

Cao Guoping,Huang Houbing^ORCID,Ma Xingqiao

Publisher

MDPI AG

Subject

Fluid Flow and Transfer Processes,Computer Science Applications,Process Chemistry and Technology,General Engineering,Instrumentation,General Materials Science

Link

http://www.mdpi.com/2076-3417/7/11/1162/pdf

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5. Polarization switching of the incommensurate phases induced by flexoelectric coupling in ferroelectric thin films

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