Parameters Design and Optimization of SiC MOSFET Driving Circuit with Consideration of Comprehensive Loss and Voltage Stress

Author:

Qin Haihong1,Ba Zhenhua1,Xie Sixuan1,Zhang Zimo1,Chen Wenming1,Xun Qian2ORCID

Affiliation:

1. Department of Electrical Engineering, the Center for More-Electric-Aircraft Power System, Nanjing University of Aeronautics and Astronautics, Nanjing 211106, China

2. Department of Electrical Engineering, Chalmers University of Technology, 41279 Gothenburg, Sweden

Abstract

In conventional parameters design, the driving circuit is usually simplified as an RLC second-order circuit, and the switching characteristics are optimized by selecting parameters, but the influence of switching characteristics on the driving circuit is not considered. In this paper, the insight mechanism for the gate-source voltage changed by overshoot and ringing caused by the high switching speed of SiC MOSFET is highlighted, and we propose an optimized design method to obtain optimal parameters of the SiC MOSFET driving circuit with consideration of parasitic parameters. Based on the double-pulse circuit, we evaluated the influence of main parameters on the gate-source voltage, including driving voltage, driving resistance, gate parasitic inductance, and stray inductance of the power circuit. A SiC-based boost PFC is constructed and tested. The test results show that the switching loss can be reduced by 7.282 W by using the proposed parameter optimization method, and the over-voltage stress of SiC MOSFET is avoided.

Funder

the State Key Laboratory of Wide-Bandgap Semiconductor Power Electronic Devices, China

the National Natural Science Foundation of China

Publisher

MDPI AG

Subject

Electrical and Electronic Engineering,Mechanical Engineering,Control and Systems Engineering

Reference22 articles.

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5. Experimental evaluation of SiC MOSFETs in comparison to Si IGBTs in a soft-switching converter;Zhou;IEEE Trans. Ind. Appl.,2020

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