Background and Blended Spectral Line Reduction in Precision Spectroscopy of EUV and X-ray Transitions in Highly Charged Ions-Reference-Cited by-同舟云学术

Background and Blended Spectral Line Reduction in Precision Spectroscopy of EUV and X-ray Transitions in Highly Charged Ions

Published:2023-03-03 Issue:3 Volume:11 Page:48
ISSN:2218-2004
Container-title:Atoms
language:en
Short-container-title:Atoms

Author:

Hosier Adam¹^ORCID,Dipti ²^ORCID,Yang Yang¹,Szypryt Paul³^ORCID,Mondeel Grant P.¹,Naing Aung²^ORCID,Tan Joseph N.⁴,Silwal Roshani⁵,O’Neil Galen³^ORCID,Lapierre Alain⁶,Blundell Steven A.⁷,Gillaspy John D.²⁸,Gwinner Gerald⁹^ORCID,Villari Antonio C. C.⁶,Ralchenko Yuri⁴^ORCID,Takacs Endre¹²^ORCID

Affiliation:

1. Department of Physics and Astronomy, Clemson University, Clemson, SC 29634, USA

2. Associate, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA

3. National Institute of Standards and Technology, Boulder, CO 80305, USA

4. National Institute of Standards and Technology, Gaithersburg, MD 20899, USA

5. Department of Physics and Astronomy, Appalachian State University, Boone, NC 28608, USA

6. Facility for Rare Isotope Beams, 640 S Shaw Ln, East Lansing, MI 48824, USA

7. CEA, CNRS, IRIG, SyMMES, University of Grenoble Alpes, 38000 Grenoble, France

8. National Science Foundation, Alexandria, VA 22314, USA

9. Department of Physics and Astronomy, University of Manitoba, Winnipeg, MB R3T 2N2, Canada

Abstract

Extreme ultraviolet spectra of Na-like and Mg-like Os and Ir were recorded at the National Institute of Standards and Technology using a grazing incidence spectrometer. We report a method in EBIT spectral analysis that reduces signals from contaminant lines of known or unknown origin. We utilize similar ion charge distributions of heavy highly charged ions that create similar potentials for lighter contaminating background elements. First-order approximations to ion distributions are presented to demonstrate differences between impurity elements with and without heavy ions present.

Funder

NIST National Institute of Standards and Technology

NSF National Science Foundation

Publisher

MDPI AG

Subject

Condensed Matter Physics,Nuclear and High Energy Physics,Atomic and Molecular Physics, and Optics

Link

https://www.mdpi.com/2218-2004/11/3/48/pdf

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