Single-Lens Imaging Spectral Restoration Method Based on Gradient Prior Information Optimization

Author:

He Peidong12,Li Zekun3,Wang Jianwei12ORCID,Tang Yinhui124,Bai Yang12,Lv Qunbo124

Affiliation:

1. Aerospace Information Research Institute, Chinese Academy of Sciences, No. 9 Dengzhuang South Road, Haidian District, Beijing 100094, China

2. Department of Key Laboratory of Computational Optical Imaging Technology, Chinese Academy of Sciences, No. 9 Dengzhuang South Road, Haidian District, Beijing 100094, China

3. National Computer Network Emergency Response Technical Team, Coordination Center of China, Beijing 100049, China

4. School of Optoelectronics, University of Chinese of Academy Sciences, No. 19 (A) Yuquan Road, Shijingshan District, Beijing 100039, China

Abstract

Single-lens imaging systems can capture spectral information, but they are affected by aberrations, defocusing, and other factors, leading to spectral data overlap. It is then necessary to perform restoration on overlapped spectral data. The restoration method should not only deblur image information, but also recover spectral information for each wavelength band. In other words, the restoration process needs to handle both spatial and spectral information in parallel while ensuring that neither is distorted. In this study, while considering the characteristics of capturing overlapped information in a single-lens imaging system, a spectrum restoration method based on gradient prior information optimization is proposed. This method is shown to achieve high-quality restoration of both images and spectra. The feasibility of this algorithm is demonstrated through simulation and experimental verification, which show that the restoration quality of spectra using the proposed algorithm is improved compared to that achieved using the MTV algorithm.

Funder

the Strategic Priority Research Program of the Chinese Academy of Sciences

Publisher

MDPI AG

Subject

Fluid Flow and Transfer Processes,Computer Science Applications,Process Chemistry and Technology,General Engineering,Instrumentation,General Materials Science

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