Influence of Ink Properties on the Morphology of Long-Wave Infrared HgSe Quantum Dot Films

Abstract

As the core device of the miniature quantum dot (QD) spectrometer, the morphology control of the filter film array cannot be ignored. We eliminated strong interference from additives on the spectrum of a long-wave infrared (LWIR) QD filter film by selecting volatile additives. This work is significant for detecting targets by spectroscopic methods. In this work, a filter film with characteristic spectral bands located in the LWIR was obtained by the natural evaporation of QD ink, which was prepared by mixing various volatile organic solvents with HgSe QD–toluene solution. The factors affecting the morphology of HgSe LWIR films, including ink surface tension, particle size, and solute volume fraction, were the main focus of the analysis. The experimental results suggested that the film slipped in the evaporation process, and the multilayer annular deposition formed when the surface tension of the ink was no more than 24.86 mN/m. The “coffee ring” and the multilayer annular deposition essentially disappeared when the solute particles were larger than 188.11 nm. QDs in the film were accumulated, and a “gully” morphology appeared when the solute volume fraction was greater than 0.1. In addition, both the increase rate of the film height and the decrease rate of the transmission slowed down. The relationship between film height and transmission was obtained by fitting, and the curve conformed to the Lambert–Beer law. Therefore, a uniform and flat film without “coffee rings” can be prepared by adjusting the surface tension, particle size, and volume fraction. This method could provide an empirical method for the preparation of LWIR QD filter film arrays.